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특허명 중국) Solar cell and photovoltaic module
국가 [중국]  출원인 ZHEJIANG JINKO SOLAR CO., LTD.(CN)
우선권 번호 CN 202510732516.3 우선일 2025.06.03
출원번호 US 19/261,312 출원일 2025.07.07
등록번호 US 12745483 B2 특허 등록일 2026.09.22
패밀리특허 - IPC H10F 77/14 H10F 77/20
산업구분 [태양에너지]  등록일 2026.11.02
기판의 전면에 고농도·저농도 도핑 영역이 교대로 배치된 에미터 구조를, 후면에 기판과 같은 도전형의 고농도·저농도 도핑 영역이 교대로 배치된 도핑 도전 구조를 두고 각 고농도 영역 위에 제1·제2 전극을 배치한 양면 선택적 도핑 태양광 셀로, 기판 도핑농도 대비 90~110nm 깊이 평균 도핑농도 비율로 정의한 도핑농도지수를 고농도 영역 10~1×10^7, 저농도 영역 1~100으로 설정해 전극 접촉저항과 재결합을 동시에 낮춰 광전변환효율을 높이는 발명임
특허 원문 발췌
제목 :
중국) Solar cell and photovoltaic module
독립항 :
1. A solar cell, comprising:
a substrate having a first surface and a second surface arranged opposite to each other along a thickness direction of the substrate;
an emitter structure, arranged on the first surface of the substrate, and comprising a first heavily doped region and a first lightly doped region arranged alternately;
a doped conductive structure, disposed on the second surface of the substrate, and comprising a second heavily doped region and a second lightly doped region alternately arranged; the second heavily doped region, the second lightly doped region and the substrate having the same conductivity type;
a first electrode disposed at least on the first heavily doped region of the emitter structure and electrically connected to the first heavily doped region; and
a second electrode disposed at least on the second heavily doped region of the doped conductive structure and electrically connected to the second heavily doped region;
wherein a doping concentration index of the first heavily doped region is greater than a doping concentration index of the first lightly doped region; the doping concentration index of the first heavily doped region is a ratio of an average doping concentration of the first heavily doped region within a preset depth range to a doping concentration of the substrate, and the doping concentration index of the first lightly doped region is a ratio of an average doping concentration of the first lightly doped region within the preset depth range to the doping concentration of the substrate; and
a doping concentration index of the second heavily doped region is greater than a doping concentration index of the second lightly doped region; the doping concentration index of the second heavily doped region is a ratio of an average doping concentration of the second heavily doped region within the preset depth range to the doping concentration of the substrate, and the doping concentration index of the second lightly doped region is a ratio of an average doping concentration of the second lightly doped region within the preset depth range to the doping concentration of the substrate;
wherein the doping concentration index of the first heavily doped region is in a range from 10 to 1×107, and the doping concentration index of the first lightly doped region is in a range from 1 to 100;
the doping concentration index of the second heavily doped region is in a range from 10 to 1×107, and the doping concentration index of the second lightly doped region is in a range from 1 to 100; and
the preset depth range is from 90 nm to 110 nm.